imx6ul+ddr3可以直接进行压力测试，但是自校验失败

eefocus_3945441

测试软件版本：ddr_stress_tester_v3.00


进行DDR校准的时候报错如下，但是可以直接进行超频测试，是什么原因呢？

============================================
        DDR Stress Test (3.0.0)
        Build: Dec 14 2018, 14:13:14
        NXP Semiconductors.
============================================

============================================
        Chip ID
CHIP ID = i.MX6 UltraLite(0x64)
Internal Revision = TO1.2
============================================

============================================
        Boot Configuration
SRC_SBMR1(0x020d8004) = 0x00002092
SRC_SBMR2(0x020d801c) = 0x01000041
============================================

ARM Clock set to 528MHz

============================================
        DDR configuration
DDR type is DDR3
Data width: 16, bank num: 8
Row size: 14, col size: 10
Chip select CSD0 is used
Density per chip select: 256MB
============================================

Current Temperature: 42
============================================

DDR Freq: 396 MHz

ddr_mr1=0x00000000
Start write leveling calibration...
running Write level HW calibration
  MPWLHWERR register read out for factory diagnostics:
  MPWLHWERR PHY0 = 0x0000000f


HW WL cal status: no suitable delay value found for byte 1
Write leveling calibration completed but failed, the following results were found:
    MMDC_MPWLDECTRL0 ch0 (0x021b080c) = 0x001F0000
Write DQS delay result:
   Write DQS0 delay: 0/256 CK
   Write DQS1 delay: 31/256 CK


Error: failed during write leveling calibration

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